AGM separator for 36 V batteriesMATSUNAMI, Yoshiaki; ENDO, Hideo; SUGIYAMA, Shoji et al.Journal of power sources. 2003, Vol 116, Num 1-2, pp 145-150, issn 0378-7753, 6 p.Conference Paper

Realization of higher current density in the solar cell of SINP architectureMA, Z. Q; HE, B; LI, F et al.Solar energy materials and solar cells. 2011, Vol 95, Num 1, pp 89-92, issn 0927-0248, 4 p.Conference Paper

Comparison of assumptions in computation of short circuit forces in transformersSALON, Sheppard; LAMATTINA, Bruce; SIVASUBRAMANIAM, Kiruba et al.IEEE transactions on magnetics. 2000, Vol 36, Num 5, pp 3521-3523, issn 0018-9464, 1Conference Paper

La détection des courts-circuits sur les lignes de la RATP = Short circuit detection on RATP linesBUHOUR, Y; VENARD, C.Revue générale des chemins de fer (1924). 1984, Vol 103, pp 133-140, issn 0035-3183Article

Modeling the short-circuit current density of polymer solar cells based on P3HT:PCBM blendMONESTIER, Florent; SIMON, Jean-Jacques; TORCHIO, Philippe et al.Solar energy materials and solar cells. 2007, Vol 91, Num 5, pp 405-410, issn 0927-0248, 6 p.Conference Paper

Vacuum circuit breaker current-zero phenomenaVAN LANEN, Ezra P. A; POPOV, Marjan; VAN DER SLUIS, Lou et al.IEEE transactions on plasma science. 2005, Vol 33, Num 5, pp 1589-1593, issn 0093-3813, 5 p., 1Conference Paper

Experimental simulation of internal short circuit in Li-ion and Li-ion-polymer cellsWEI CAI; WANG, Hsin; MALEKI, Hossein et al.Journal of power sources (Print). 2011, Vol 196, Num 18, pp 7779-7783, issn 0378-7753, 5 p.Article

Evaluation of mechanical abuse techniques in lithium ion batteriesLAMB, Joshua; ORENDORFF, Christopher J.Journal of power sources (Print). 2014, Vol 247, pp 189-196, issn 0378-7753, 8 p.Article

SIMS depth profiling analysis of electrical arc residues in fire investigationCHEN, C. Y; LING, Y. C; WANG, J. T et al.Applied surface science. 2003, Vol 203-04, pp 779-784, issn 0169-4332, 6 p.Conference Paper

Propriétés des pannes du type «court-circuit» dans les circuits combinatoiresSAPOZHNIKOV, V. V; SAPOZHNIKOV, V. V; SAPOZHNIKOV, V. V; SAPOZHNIKOV, V. V; CHUKHONIN, V. M et al.Avtomatika i telemehanika. 1984, Num 3, pp 142-150, issn 0005-2310Article

Echauffement et séchage des transformateurs par court-circuitage monophasé selon le schéma de couplage «étoile, -étoile-neutre»KISEL, O. B; REJMER, A. A.Promyšlennaja energetika. 1983, Num 10, pp 12-15Article

Regulation of mastoparan-induced increase of paracellular permeability in T84 cells by RhoA and basolateral potassium channelsBLUMENSTEIN, Irina; GERHARD, Ralf; RIES, Jürgen et al.Biochemical pharmacology. 2003, Vol 65, Num 7, pp 1151-1161, issn 0006-2952, 11 p.Article

Kurzschlussfestigkeit von Induktionszählern = La tenue aux courts-circuits des compteurs à induction = The short-circuit performances of induction metersHEMMING, B.Elektrizitätswirtschaft. 1985, Vol 84, Num 9, pp 315-317, issn 0013-5496Article

A Novel Approach to Investigate the Quantitative Impact of Harmonic Currents on Winding Losses and Short Circuit Forces in a Furnace TransformerCHEEMA, M. A. M; FLETCHER, J. E; DORRELL, D et al.IEEE transactions on magnetics. 2013, Vol 49, Num 5, pp 2025-2028, issn 0018-9464, 4 p.Conference Paper

SHORT CIRCUIT CURRENT AND TOTAL CONDUCTANCE MEASUREMENTS ON RAT ILEUM.GRACA EMILIO M; HENRIQUEZ DE JESUS C.1977; J. PHYSIOL.; G.B.; DA. 1977; VOL. 270; NO 1; PP. 209-222; BIBL. 22 REF.Article

Saturation Current and On-Resistance Correlation during During Repetitive Short-Circuit Conditions on SiC JFET TransistorsBERKANI, M; LEFEBVRE, S; KHATIR, Z et al.IEEE transactions on power electronics. 2013, Vol 28, Num 2, pp 621-624, issn 0885-8993, 4 p.Article

Simulations and Tests of MCP-BSCCO-2212 Superconducting Fault Current LimitersDE SOUSA, W. T. B; POLASEK, A; SILVA, F. A et al.IEEE transactions on applied superconductivity. 2012, Vol 22, Num 2, issn 1051-8223, 5600106.1-5600106.6Article

Analyza priebehu napatia pri zuarani v CO₂ v oblasti Skratoveho procesu = Analyse de la forme d'onde de la tension lors du soudage MAG en régime de court-circuit = Analysis of voltage waveform in CO₂ welding under shortcircuiting conditionsONDREJCEK, P; SLOVAK, J; VINS, F et al.1985, Vol 34, Num 4, pp 73-81, issn 0322-9785Article

Multi-machine transient modelling of wind farms: An essential approach to the study of fault conditions in the distribution networkZUBIA, I; OSTOLAZA, J. X; SUSPERREGUI, A et al.Applied energy. 2012, Vol 89, Num 1, pp 421-429, issn 0306-2619, 9 p.Article

Influence de l'effet de «court-circuit» sur la dynamique d'une comète artificielle (expérience AMPTE)MISHIN, E. V; ROZHANSKIJ, V. A; RUZHIN, YU. YA et al.Pis′ma v žurnal èksperimental′noj i teoretičeskoj fiziki. 1988, Vol 47, Num 1, pp 26-29, issn 0370-274XArticle

On the numerical complexity of short-circuit faults in logic networksSINHA, B. P; BHATTACHARYA, B. B.IEEE transactions on computers. 1985, Vol 34, Num 2, pp 186-190, issn 0018-9340Article

Gate driver for SiC JFETs with protection against normally-on behaviour induced faultGUEDON, F; SINGH, S. K; MCMAHON, R. A et al.Electronics letters. 2011, Vol 47, Num 6, pp 375-377, issn 0013-5194, 3 p.Article

Control panels get new ratings : A new supplement to the UL codes dictates all low-voltage control panels be rated for short-circuit currentTENNANT, Lori.Machine design. 2006, Vol 78, Num 10, issn 0024-9114, 72-77 [5 p.]Article

Speed of motion of a short-circuit arc in an insulated conductorTITKOV, V. V.Journal of applied mechanics and technical physics. 2003, Vol 44, Num 1, pp 129-134, issn 0021-8944, 6 p.Article

Kurzschlussbeanspruchung und- festigkeit von Hochspannungs-Stützisolatoren = Contraine de court-circuit et tenue des isolateurs rigides HT = Short-circuit stresses and with stand of h.V. past insulatorsMIRI, A. M; STEIN, N.ETZ-Archiv. 1988, Vol 10, Num 3, pp 89-96, issn 0170-1703Article